
Researchers at the National Constitute of Standards and Engineering (NIST) have matured a performing to measure the toughness—the resistance to fracture—of the thin insulating films that play a critical enactment in high-performance interconnected circuits.

Filed under: insulating films, semiconductor industry, tough nut, enactment, toughness, fracture, high performance, circuits |
Tagi: insulating films, semiconductor industry, tough nut, enactment, toughness, fracture, high performance, circuits